Batik Visualization
Brian Wyvill
Kees van Overveld
Sheelagh Carpendale
We present an algorithm for simulating the cracks found in Batik wax painting and dyeing technique used to make images on cloth. The algorithm produces cracks similar to those found in batik due to the wax cracking in the dyeing process. The method is unlike earlier simulation techniques used in computer graphics, in that it is based on the Distance Transform algorithm rather than on a physically based simulation such as using spring mass meshes orfinite element methods. Such methods can be difcult to implement and computationally costly due to the large numbers of equations that need to be solved. In contrast, our method is simple to implement and takes only a few seconds to produce convincing patterns that capture many of the characteristics of the crack patterns found in real Batik cloth.
Images
Publications
Brian Wyvill, Kees van Overveld and M.Sheelagh T. Carpendale. Rendering Cracks in Batik. In Proceedings of the 3rd International Symposium on Non-Photorealtistic Rendering, NPAR”04. ACM Press, pages 61-67, 2004. | ||
B. Wyvill, K. van Overveld and M. S. T. Carpendale. The Batik Trick. In Proceedings of the Western Computer Graphics Symposium, pages 59-66, 2003. | ||
B. Wyvill, K. van Overveld and M.S.T. Carpendale. Visualizing Batik. Research report 2002-701-04, Department of Computer Science, University of Calgary, Calgary, AB, Canada, 2003. |